@article{:14,
author = {[null, DUAN Ku-Yu, YUE -Lu]},
title = {<span class="fontstyle0">Statistical static timing analysis for circuit aging prediction</span><span>&nbsp;</span>},
publisher = {The Journal of China Universities of Posts and Telecommunications},
year = {2021},
journal = {Journal of China Universities of Posts and Telecommunications},
volume = {28},
number = {2},
eid = {14},
pages = {14-23},
keywords = {<span class="fontstyle0">bias temperature instability (BTI), reliability, prediction, statistical static timing analysis (SSTA)</span><span>&nbsp;</span><br />
<span></span>},
doi = https://jcupt.bupt.edu.cn/EN/10.19682/j.cnki.1005-8885.2021.1002
}