@article{TAN Li-li:67,
author = {[TAN Li-li, WAN Qian, WANG Ya-wen, XING Ying]},
title = {Modeling Test Case Fault-detecting Capacity Based on Fault Detection Difficulty Level},
publisher = {Journal of Beijing University of Posts and Telecommunications},
year = {2017},
journal = {Journal of Beijing University of Posts and Telecommunications},
volume = {40},
number = {5},
eid = {67},
pages = {67-74},
keywords = {software testability;mutation testing;random test case generation;logistic model},
doi = https://journal.bupt.edu.cn/EN/10.13190/j.jbupt.2016-284
}