TY  - Journal of Beijing University of Posts and Telecommunications
A1  - ZHOU Yi-lin, YANG Lu, LU Wen-rui
T1  - Exploring the Life Modeling Methods for Electrochemical Migration Failure of Printed Circuit Board under Dust Particles
Y1  - 2020-06-24 00:00:00.0
JF  - Journal of Beijing University of Posts and Telecommunications
JO  - Journal of Beijing University of Posts and Telecommunications
SP  - 11
EP  - 18,31
VL  - 43
IS  - 3
UR  - {https://journal.bupt.edu.cn/EN/10.13190/j.jbupt.2019-170}
N1  - 10.13190/j.jbupt.2019-170
ER  -